The mission of the Applied Physics Division is to advance measurement science and technology in areas of critical importance to national priority needs, such as, advanced manufacturing, national security, quantum communications, strategic computing, and quantitative imaging! We're looking for a Physicist to join our team! This notice is issued under direct-hire authority to recruit new talent to occupations for which NIST has a severe shortage of candidates.

Duties

The mission of the Applied Physics Division is to advance measurement science and technology in areas of critical importance to national priority needs, such as, advanced manufacturing, national security, quantum communications, strategic computing, and quantitative imaging! As the new Physicist on our team you will: Research and develop scanning probe microscopy (SPM) measurement techniques for the characterization of defects in GaN and related semiconductors. Integrate conventional deep level optical spectroscopy (DLOS) with a scanning probe platform for local microscopy and microanalysis of surfaces and subsurface interfaces. Utilize this new DLOS-SPM platform to characterize electrical test structures including GaN nanostructures with controlled defects, as well as trapped charge carriers in device structures. Develop and optimize analyses and/or models of local scanning probe measurements in order to interpret data and extract defect modeling parameters such as concentration and energy level. Communicate and collaborate with team members, other NIST teams, and external teams. Present and publish nonproprietary results as appropriate.

Requirements

• U.S. citizenship
• Males born after 12-31-59 must be registered for Selective Service
• Suitable for Federal employment
• Bargaining Unit Position: No

Qualifications

Individual Occupational Requirements Basic Requirements: 1. Degree: physics; or related degree that included at least 24 semester hours in physics. OR 2. Combination of education and experience -- courses equivalent to a major in physics totaling at least 24 semester hours, plus appropriate experience or additional education. In either A or B above, the courses must have included a fundamental course in general physics and, in addition, courses in any two of the following: electricity and magnetism, heat, light, mechanics, modern physics, and sound. In addition to the basic requirements, applicants must also have 1 year (52 weeks) of specialized experience equivalent to at least the GS-9 (ZP-II at NIST) level. Specialized Experience is defined as: Local nanoscale measurements of materials with scanning probe microscopy and microanalysis techniques, such scanning tunneling microscopy (STM), atomic force microscopy (AFM), scanning electron microscopy (SEM), or scanning tunneling spectroscopy (STS). Maintenance, customization, or optimization of instrumentation for nanoscale scanning probe measurements of semiconductor materials and devices. AND publication of original research in peer-reviewed journals and presentation of findings at technical meetings or workshops. OR Master's or equivalent graduate degree as defined in the basic requirements. OR A combination of graduate education and specialized experience as defined in the additional requirements. Experience refers to paid and unpaid experience, including volunteer work done through National Service programs (e.g., Peace Corps, AmeriCorps) and other organizations (e.g., professional; philanthropic; religious; spiritual; community, student, social). Volunteer work helps build critical competencies, knowledge, and skills and can provide valuable training and experience that translates directly to paid employment. You will receive credit for all qualifying experience, including volunteer experience. The qualification requirements in this vacancy announcement are based on the U.S. Office of Personnel Management (OPM) Qualification Standards Handbook. Applicant Reconsideration

Education

This position has an education requirement. Transcripts must be submitted to validate that the education requirement has been met. Unofficial transcripts will be accepted in the application package. However, an official copy will be required before a final offer of employment.

Use of foreign education for qualifications. An accredited organization must evaluate education completed outside of the U.S. to ensure that it is comparable to education received in accredited institutions in the U.S. Click here to view a listing of accredited organizations from the Department of Education's website. A copy of the foreign education evaluation (containing the results with course-by-course listing) is required with your application.

Contacts

• Address Applied Physics Division 100 Bureau Drive Gaithersburg, MD 20899 US
• Name: Tailor Thompson
• Email: [email protected]