NIST works with industry and science to advance innovation and improve quality of life. We're looking for a Physical Scientist to join our team! This notice is issued under direct-hire authority to recruit new talent to occupations for which NIST has a severe shortage of candidates.

Duties

Perform atom probe tomography analysis of materials, structures, and devices of interest to the semiconductor industry using commercially available atom probe instruments at NIST. Use dual-beam focused ion beam/scanning electron microscope (FIB/SEM) to prepare bulk or site-specific specimens. Design atom probe experiments to optimize measurement conditions for desired result (e.g. yield/survivability, composition, cluster analysis, etc.). Understand the effect of specimen shape, analysis geometry, and analysis conditions on experimental result. Develop recipes and scripts to automate sample preparation and to fabricate reproducible specimen shapes in large numbers for statistical analysis. May perform statistical Design of Experiments for both atom probe and FIB experiments. Automate data collection on atom probe instruments using vendor provided scripting. Communicate and collaborate with team members, other NIST teams, and external teams.

Requirements

• U.S. citizenship
• Males born after 12-31-59 must be registered for Selective Service
• Suitable for Federal employment
• Bargaining Unit Position: No

Qualifications

BASIC REQUIREMENTS: A. Degree: physical science, engineering, or mathematics that included 24 semester hours in physical science and/or related engineering science such as mechanics, dynamics, properties of materials, and electronics. OR B. Combination of education and experience -- education equivalent to one of the majors shown in A above that included at least 24 semester hours in physical science and/or related engineering science, plus appropriate experience or additional education. AND In addition to the basic requirements: Applicants must also have 1 year (52 weeks) of specialized experience equivalent to at least the GS-9 (ZP-II at NIST) level. Specialized Experience is defined as experience with Atom probe tomography (APT) and Focused ion beam/Scanning electron microscopy (FIB/SEM). OR Master's or equivalent graduate degree OR A combination of graduate education and specialized experience as defined in the additional requirements Experience refers to paid and unpaid experience, including volunteer work done. We will credit all qualifying volunteer experience in your application. The qualification requirements in this vacancy announcement are based on the U.S. Office of Personnel Management (OPM) Qualification Standards Handbook. Applicant Reconsideration

Education

This position has an education requirement. Transcripts must be submitted to validate that the education requirement has been met. Unofficial transcripts will be accepted in the application package. However, an official copy will be required prior to a final offer of employment.

Education completed outside of the U.S. must be evaluated by an accredited organization to ensure that it is comparable to education received in accredited institutions in the U.S. Click here to view a listing of accredited organizations from the Department of Education's website. A copy of the foreign education evaluation (containing the results with a course by course listing) is required with your application.

Contacts

• Address Applied Chemicals and Materials Division 100 Bureau Drive Gaithersburg, MD 20899 US
• Name: Tailor Thompson
• Email: [email protected]